Alignment system for optical analyte testing meter components
US6009632A · kind A · utility
30Cited by
19References
30Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 12, 1997 |
| Grant date | Jan 4, 2000 |
| Priority date | — |
| Expiry date | Dec 12, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/7773
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An analyte testing meter is provided with a template for facilitating assembly during the manufacturing process. The template aligns the electro-optics components on the printed circuit board and aligns the optics block containing light directing elements such as lenses, waveguides and beamsplitters with the electro-optics elements. Other alignment features are provided which improve precision of the assembled product and obviate the need for expensive alignment equipment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.