Multi-dimensional pattern analysis
US6018734A · kind A · utility
66Cited by
8References
6Claims
0Family size
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Key dates
| Filing date | Sep 28, 1998 |
| Grant date | Jan 25, 2000 |
| Priority date | — |
| Expiry date | Sep 28, 2018 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S707/99933
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A pattern recognition method applicable to unique associated pattern recognition in a structured information system or structured database is presented. The process may be used to find patterns in a column which are associated with unique data values in another column, or to find the number of unique values in the second column which are paired with the same associated pattern in the first column. The technique is easily extended to more general cases in which both the condition field and the associated pattern field may be two groups of fields.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.