Patent · US Expired

Phase interference microscope

US6020965A · kind A · utility

3Cited by
5References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateMar 5, 1998
Grant dateFeb 1, 2000
Priority date
Expiry dateMar 5, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/303
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A phase interference microscope, comprising a light source for emitting coherent light with a constant wavelength, an interference optical system for splitting the light emitted from the light source into two light beams, irradiating one of the split light beams onto a sample and the other split light beam onto a reference mirror, and making the light beam reflected from the sample interfere with the light beam reflected from the reference mirror, a focusing device for recognizing a position of a middle point in a phase anomaly of interference light generated in the vicinity of a focusing point as a focusing point for the sample, and moving the sample to the focusing position, and a size measurement device for measuring a size of the sample on the basis of the interference light.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.