X-ray apparatus with sensor matrix

US6021173A · kind A · utility

Assignee

• U.S. Philips Corporation · US

Inventors

• Andreas Brauers · Aachen, DE
• Rudolf Kemner · Eindhoven, NL
• Ulrich Schiebel · Aachen, DE
• Herfried Karl Wieczorek · Aachen, DE

Key dates

• Filing date: Mar 30, 1998
• Grant date: Feb 1, 2000
• Expiry date: Mar 30, 2018

Classification

• Technology area (CPC H): Electricity
• CPC primary: H10F39/189

Abstract

An x-ray examination apparatus comprises an x-ray detector with a sensor matrix for deriving an image signal from an x-ray image. The x-ray detector is provided with a scatter grid having a regular pattern of x-ray attenuating partitions. The spatial resolution of the sensor matrix is such that the size of the smallest detectable detail in the x-ray image is larger than the distance between adjacent partitions. In particular the x-ray detector comprises an x-ray sensitive photoconductor layer for converting x-rays into electric charges, separate sensor elements include respective collecting electrodes and a semiconductor cladding layer being disposed between the photoconductor layer and the collecting electrodes. The semiconductor cladding layer has a substantial lateral electric conductivity. For example, the semiconductor cladding layer is a chlorine doped selenium layer, or a selenium, sulphur or telluride doped lead-oxide layer.