Device having dual sensors for checking patterns disposed on a material strip method for checking patterns, and the material strip
US6021950A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Feb 10, 1997 |
| Grant date | Feb 8, 2000 |
| Priority date | — |
| Expiry date | Feb 10, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06K19/06037
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method and device for checking patterns (1) disposed on a material strip (30) which patterns (1) consist of groups of dark and light areas (2,2*,3,3*) succeeding in the travelling direction (v) of the material strip (30) and the checking respectively, by displacing the position of the dark areas (2,3) and/or the light areas (2*,3*) of one group with respect to a related detector (8,9) in regard to the dark areas (2,3) and/or light areas (2*,3*) of another group with respect to another related detector (8,9) by detecting the existence or non-existence of dark areas and/or light areas and by creating a sequence of output signals dependent on the result of the detection by combining the output signals comprising information concerning the dark or light areas (2,2*,3,3*) of each detector (8,9) with the output signals depending on the detection of one of the dark or light areas (2,2*,3,3*) of the other detector (8,9) in a predetermined way by for example alternately activating each detector (8,9) by the other detector (8,9) and by comparing this sequence of output signals with a predetermined sequence of signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.