Dual-contact probe tip for flying probe tester
US6023171A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 13, 1997 |
| Grant date | Feb 8, 2000 |
| Priority date | — |
| Expiry date | Aug 13, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07342
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A dual contact probe tip is provided within a flying probe circuit tester to make separate electrical contacts with a circuit under test at two closely-spaced test points. The tip includes a mounting block having an attachment section attached to a carriage of the tester and a pair of flexible cantilever sections, with a probe pin extending from a distal end of each of these cantilever sections to make contact with the circuit. One electrical path is established through the conductive mounting block and one of the probe pins. The other probe pin is coated with an insulating material except for its point and for a surface to which a wire is soldered, so that the other electrical path is established through this other probe pin and the attached wire. Each probe pin is tapered toward its point, and the probe pins extend from the mounting block at an oblique angle toward one another.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.