Patent · US Expired

Nonvolatile semiconductor memory and read method

US6026014A · kind A · utility

28Cited by
5References
37Claims
0Family size

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Key dates

Filing dateDec 19, 1997
Grant dateFeb 15, 2000
Priority date
Expiry dateDec 19, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C2211/5642
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In a nonvolatile semiconductor memory in which multiple-value information is stored in one memory cell by setting a plurality of threshold values, data is successively read from word lines while continuously changing the word-line read level from a lowest level to a highest level, and the next bit line is selectively precharged in accordance with the data stored in latch means for storing read data.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.