Patent · US Expired

Multi-through hole testing plate for high throughput screening

US6027873A · kind A · utility

85Cited by
11References
31Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 19, 1999
Grant dateFeb 22, 2000
Priority date
Expiry dateMar 19, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2035/00237
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for holding samples for analysis and an apparatus thereof includes a testing plate with a pair of opposing surfaces and a plurality of holes. Each of the holes extends from one of the opposing surfaces to the other one of the opposing surfaces. The holes are arranged in groups, where each group has at least two rows and two columns of holes. The groups are arranged in sets, where each set has at least two rows and two columns of groups. To analyze samples, at least one of the opposing surfaces of the testing plate is immersed in a solution to be analyzed. A portion of the solution enters openings for each of the holes in the immersed opposing surface. Once the holes are filled with solution, the testing plate is removed and is held above a supporting surface. Surface tension holds the solution in each of the holes. The solution in one or more of the holes is then analyzed and the solution in one of these holes is identified for further study. The location of the identified solution is marked based upon its location within a particular set and group of holes.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.