Patent · US Expired

Method and apparatus for performing scan testing

US6032278A · kind A · utility

17Cited by
9References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 26, 1996
Grant dateFeb 29, 2000
Priority date
Expiry dateDec 26, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/318541
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for providing a scan cell having a first input coupled to receive a data, a data output and a scan output. The scan cell being capable of transferring data to said scan output in response to a first scan clock and a second scan clock without requiring any timing-sensitive control signals.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.