Patent · US Expired

Measuring device and method for making same

US6033916A · kind A · utility

16Cited by

8References

7Claims

0Family size

Assignee

Micronas Intermetall GmbH · DE

Inventors

Ulrich Sieben · Meßkirch, DE
Bernhard Wolf · Poing, DE
Hellmut Haberland · Bötzingen, DE
Christoph Cremer · Heidelberg, DE

Key dates

Filing date	Jan 17, 1997
Grant date	Mar 7, 2000
Priority date	—
Expiry date	Jan 17, 2017

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S436/805
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A measuring device for measuring or examining physiological parameters on biocomponents includes an FET sensor 5 whose electrical protective layer 12 is roughened or has a structured coating 15. The structuring of the active sensor contact surface 12 is adapted to the outer contour and topography of the biocomponent in question, so that a better possibility is available for anchoring the biocomponents to the contact surface 24 forming the FET protective layer of the sensor 5.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.