Apparatus and method for testing flexible circuit substrates
US6034524A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 17, 1997 |
| Grant date | Mar 7, 2000 |
| Priority date | — |
| Expiry date | Jul 17, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system for applying electrical tests to circuits on flexible substrates includes a first transport system moving frames, each of which is configured for holding a single such flexible substrate, a loading station in which the substrates are individually loaded onto the frames, a testing station in which the electrical tests are applied, and an unloading station in which the substrates are removed from the frames. Within the testing station, each frame is disengaged from the first transport system and fastened to a second transport system, which moves the frame in a pattern causing a number of segments of the substrate within the frame to be placed between probe arrays adjacent each of the opposite sides of the substrate. These arrays are each aligned with visual markings on the adjacent side of the substrate, and the arrays are then moved into engagement with the substrate for the testing process. When testing of a particular substrate is complete, the frame is disengaged from the second transport system and fastened to the first transport system to be carried to the unloading station.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.