Method for determining the retardation of a material using non-coherent light interferometery
US6034774A · kind A · utility
29Cited by
15References
11Claims
0Family size
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Key dates
| Filing date | Jun 26, 1998 |
| Grant date | Mar 7, 2000 |
| Priority date | — |
| Expiry date | Jun 26, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/06
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for determining the optical retardation of an anisotropic material. A beam of light is directed toward a sample of the material and a portion of the reflected beam is collected from the optical interfaces of the material and directed toward an interferometer. The resulting interference signal is analyzed to determine the retardation. The retardation is determined as being the distance between particular peaks of the interference signal. In a further embodiment, light from multiple wavelength light sources is directed toward the sample of the material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.