High-speed non-contact measuring apparatus for gauging the thickness of moving sheet material
US6038028A · kind A · utility
28Cited by
2References
19Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 26, 1998 |
| Grant date | Mar 14, 2000 |
| Priority date | — |
| Expiry date | Aug 26, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/0691
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical measurement apparatus is provided for measuring the thickness of a moving sheet material (18). The apparatus has a pair of optical measurement systems (21, 31) attached to opposing surfaces (14, 16) of a rigid support structure (10). A pair of high-power laser diodes (20,30) and a pair of photodetector arrays (22,32) are attached to the opposing surfaces. Light emitted from the laser diodes is reflected off of the sheet material surfaces (17, 19) and received by the respective photodetector arrays. An associated method for implementing the apparatus is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.