Method and apparatus for application's specific testing of assembled circuits
US6038520A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 2, 1998 |
| Grant date | Mar 14, 2000 |
| Priority date | — |
| Expiry date | Oct 2, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31903
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for testing specific assembled circuits begins by configuring a plurality of applications specific testing entities to test assembled circuits, where the configuring is based on the types of assembled circuits being tested. Next, a specific assembled circuit testing program is provided to the corresponding application specific testing entity based on the type of assembled circuits it is testing. In addition to providing the testing programs to the testing entities, programming instructions are provided to a programmable handler to pick and place the appropriate assembled circuits with the corresponding applications specific testing entities. When the testing of a particular assembled circuit is complete, a test complete indication is provided. When the test complete indication is received by the host, programming instructions are provided to the programmable handler to remove the integrated circuit from the testing entity and place another integrated circuit in the proximity of the testing entity for subsequent testing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.