Patent · US Expired

Fabrication of semiconductor devices

US6043443A · kind A · utility

8Cited by
5References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 23, 1998
Grant dateMar 28, 2000
Priority date
Expiry dateJan 23, 2018

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S209/936
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed is a method for fabricating devices so that several devices at a time can be tested and sorted. The devices are placed in a carrier so that each device occupies a discrete position. The carrier includes an identification marker, and each device is identified by its position in the carrier. The carrier is sent to multiple assembly and/or testing stations, and data for each device is collected and stored in a central data base according to its position in the carrier. Each device may then be sorted according to the collected data and its position in the carrier.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.