Method for temperature calibration of an optical magnetic field measurement array and measurement array calibrated by the method

US6043648A · kind A · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Peter Menke · Erlangen, DE
• Thomas Bosselmann · Erlangen, DE

Key dates

• Filing date: Dec 14, 1998
• Grant date: Mar 28, 2000
• Expiry date: Dec 14, 2018

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R33/0322
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A method for temperature calibration of an optical magnetic field measurement array and a measurement array calibrated by the method include an optical series circuit having a first optical transmission path, a first polarizer, a Faraday sensor device, a second polarizer, and a second optical transmission path. The optical series circuit is temperature-calibrated by adjusting the polarizer angles of the two polarizers in a special way. The calibration method functions even if the intrinsic axis of the linear double refraction in the sensor device is unknown.