Patent · US Expired

Fringe deflectometry apparatus and method

US6043885A · kind A · utility

37Cited by

2References

21Claims

0Family size

Assignee

Essilor International · FR

Inventors

Denis Mazuet · Paris, FR
Patrick Bertrand · Louvain-la-Neuve, BE
Do Quyen Phan · Chauconin-Neufmontiers, FR
Werner Mohr · Zwiesel, DE

Key dates

Filing date	Jan 8, 1998
Grant date	Mar 28, 2000
Priority date	—
Expiry date	Jan 8, 2018

Classification

Technology area (CPC G)Physics
CPC primaryG01M11/0242
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A fringe deflectometry apparatus illuminates an optical component to be measured using radiation with a known wavefront, deflects the radiation after it has been reflected or transmitted by the optical component to be measured, and materializes a reference ray. Transverse aberration of the reference ray after reflection or transmission by the optical component is measured. A deflectometry method using the apparatus enables an absolute phase reference to be provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.