Patent · US Expired

X-ray imaging apparatus and X-ray imaging analysis apparatus

US6044128A · kind A · utility

18Cited by
4References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 4, 1998
Grant dateMar 28, 2000
Priority date
Expiry dateFeb 4, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F39/803
  • WIPO fieldMedical technology
  • WIPO sectorInstruments

Abstract

An X-ray imaging apparatus utilized in an imaging analysis apparatus that includes plural charge conversion devices for converting irradiated X-rays into electric charge and corresponding plural charge storage devices for storing the converted electric charge. Each charge conversion device and charge storage device represent a pixel in an image and are read by a thin film transistor. A thin film diode is connected to each charge storage device to discharge excessive stored voltage. The thin film diode has a Metal-Insulator-Metal (MIM structure), a Metal Semi-Insulator (MSI structure), or a Back-to-Back (BTB structure).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.