Surface acoustic wave harmonic analysis
US6044332A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 15, 1998 |
| Grant date | Mar 28, 2000 |
| Priority date | — |
| Expiry date | Apr 15, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/0423
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for sensing and analyzing data with surface acoustic wave (SAW) devices comprises the steps of: propagating a sampling signal at a fundamental frequency through a SAW device coated for selective adsorption; measuring at least one parameter of at least one higher order harmonic of the fundamental frequency sampling signal; exposing the coated SAW device to enable the selective adsorption; measuring the at least one parameter of the at least one higher order harmonic of the fundamental frequency sampling signal after the exposing step; comparing the measurements of the at least one parameter of the at least one higher order harmonic before and after the exposing step; and, deriving a result of the selective adsorption based upon the comparing step. The at least one parameter is harmonic power and harmonic frequency. The at least one higher order harmonic is one or more odd harmonics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.