Patent · US Expired

Memory device with two ferroelectric capacitors per one cell

US6046929A · kind A · utility

19Cited by
1References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 31, 1999
Grant dateApr 4, 2000
Priority date
Expiry dateMar 31, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/223
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The source region and gate electrode of a field effect transistor including a drain region and a gate electrode in addition to the source region are connected by a first ferroelectric capacitor. The drain region and gate electrode are connected by a second ferroelectric capacitor. A ferroelectric memory device suitable for high integration is provided.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.