Method for calibrating a pick and place machine using a glass parts pick-up jig
US6050151A · kind A · utility
6Cited by
4References
1Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 20, 1998 |
| Grant date | Apr 18, 2000 |
| Priority date | — |
| Expiry date | Jan 20, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05K13/089
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method for calibrating a pick and place machine including picking a calibrated chip having a first calibration mark from a parts pick up jig with a placing head of the pick and place machine, placing the calibrated chip on a calibrated plate having a second calibration mark with the pick and place machine placing head, the calibrated plate being located on a pick and place machine assembly table and comparing the relative alignment of the first calibration mark and the second calibration mark.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.