Patent · US Expired

Nonvolatile semiconductor memory device and method for fabricating the same and semiconductor integrated circuit

US6051860A · kind A · utility

33Cited by
2References
7Claims
0Family size

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Inventors

Key dates

Filing dateJan 16, 1998
Grant dateApr 18, 2000
Priority date
Expiry dateJan 16, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/035

Abstract

In a semiconductor substrate having a surface including a first surface region at a first level, a second surface region at a second level lower than the first level, and a step side region linking the first surface region and the second surface region together, a channel region has a triple structure. Thus, a high electric field is formed in a corner portion between the step side region and the second surface region and in the vicinity thereof. A high electric field is also formed in the first surface region. As a result, the efficiency, with which electrons are injected into a floating gate, is considerably increased.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.