Patent · US Expired

Semiconductor device and fabrication method

US6051877A · kind A · utility

23Cited by
7References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 3, 1997
Grant dateApr 18, 2000
Priority date
Expiry dateJul 3, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3511
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A thin-film semiconductor device comprising at least a semiconductor element and a wiring is disclosed. A thin film of a protective insulating material is formed on the lower surface of the semiconductor element, and a substrate is bonded on the lower surface of the thin film. A method for fabricating the thin-film semiconductor device is also disclosed, in which a thin-film semiconductor circuit is formed on a silicon-on-insulator wafer, the silicon substrate on the reverse side of the silicon-on-insulator wafer is etched off, a thin-film semiconductor chip is formed and attached to the substrate, and the thin-film semiconductor chip and the substrate are wired to each other by printing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.