Patent · US Expired

Device for non-contact measurement of the surface of a three dimensional object

US6055056A · kind A · utility

18Cited by
7References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 17, 1999
Grant dateApr 25, 2000
Priority date
Expiry dateJun 17, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/2504
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This invention concerns a device for non-contact measurement of the surface of a three dimensional object in a measuring chamber with a projection device which projects a strip structure on the surface of an object, an observing device for recording the strip structure at measuring points on the surface of the object, a device for moving the object together with the observing device around a first axis of rotation, and an evaluation unit for determining the co-ordinates of the measuring points using the phase values of the strip structure in a predetermined co-ordinate system. A device (8) for moving the object about at least a second axis of rotation (D2) independent of the first axis of rotation (D1) and a calibration unit are provided, where the calibration unit (10) can determine the position of the second rotational axis (D2) in the predetermined co-ordinate system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.