Patent · US Expired

Method and apparatus for testing gang memory modules

US6055653A · kind A · utility

24Cited by
2References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 27, 1998
Grant dateApr 25, 2000
Priority date
Expiry dateApr 27, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3193
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The gangSIMM Memory Tester is a PWA which plugs directly into a CPU's SIMM slot. The gangSIMM Memory Tester contains a known good SIMM, which is connected directly to the CPU's bus. All memory functions for this SIMM slot is provided by the gold SIMM per normal SIMM operation. The CPU bus routed to the gold SIMM on the gangSIMM Memory Tester is also routed to a test bus via a buffer which provides increased drive capacity. The test bus is distributed in parallel to N number of SIMM slots located on the gangSIMM Memory Tester throughout a second set of tri-stating buffers. During read accesses to memory involving the CPUs SIMM slot location where the gangSIMM PWA is directly plugged into, data provided by the gold SIMM is compared on an individual basis with the data provided by an under-test SIMM. This operation occurs in-parallel for all under-test SIMMs.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.