Patent · US Expired

Methods and apparatus for imaging system detector alignment

US6056437A · kind A · utility

27Cited by
7References
29Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 25, 1998
Grant dateMay 2, 2000
Priority date
Expiry dateAug 25, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01T1/1648
  • WIPO fieldEnvironmental technology
  • WIPO sectorChemistry

Abstract

The present invention, in one form, is a system which, in one embodiment, determines an x-ray beam z-axis profile and properly positions a detector array. Specifically, in one embodiment, signals intensities from the detector array are used to determine the optimal position of the detector array. In addition, the signal intensities are utilized to adjust an aperture of a pre-patient collimator. By adjusting the collimator aperture an x-ray beam umbra is aligned with the edges of the detector array. As a result, an optimal x-ray beam is radiated toward the detector array.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.