Patent · US Expired

Method and apparatus for performing voltage sampling

US6057713A · kind A · utility

1Cited by
3References
22Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 12, 1998
Grant dateMay 2, 2000
Priority date
Expiry dateMar 12, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C27/024
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

Method and apparatus for performing voltage sampling. The present invention addresses the problems encountered when a voltage is applied to a voltage sampling circuit (76). An additional capacitor (88) is used to store an amount of charge similar to the amount of charge needed by a primary capacitor (89) which provides an output signal to a voltage receiving circuit (74), such as a portion of a sigma-delta analog to digital converter. The additional capacitor (88) is charged while a primary capacitor (89) is discharged in a first clock phase. Then the additional capacitor (88) and the primary capacitor (89) are both coupled to the voltage to be sampled during a second clock phase.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.