Patent · US Expired

Method for producing a semiconductor substrate

US6060344A · kind A · utility

10Cited by
6References
33Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 19, 1998
Grant dateMay 9, 2000
Priority date
Expiry dateAug 19, 2018

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/76286
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

In a method for producing a semiconductor substrate completed through a bonding process for joining a semiconductor wafer to a support substrate by performing heat treatment thereto in a state in which the semiconductor wafer is closely joined to the support substrate, the method according to the present invention includes the following steps, i.e., a depositing process for depositing a poly-crystal semiconductor which covers all areas of a surface to be bonded on the surface of the semiconductor wafer; a heat treatment process for performing the heat treatment to the semiconductor wafer provided after the depositing process, during a predetermined time under a temperature equal to or higher than the heat treatment temperature at the bonding process; and a polishing process for flattening the surface of the poly-crystal semiconductor provided after the heat treatment process. After the above processes were performed in order, the bonding process is performed after the polishing process.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.