Patent · US Expired

Method for manufacturing a flip chip semiconductor device

US6060373A · kind A · utility

70Cited by
4References
4Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 9, 1999
Grant dateMay 9, 2000
Priority date
Expiry dateJul 9, 2019

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/977
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A plurality of pad electrodes are formed on a first surface of an IC wafer, and a solder layer is formed on each of the pad electrodes. The first surface of the IC wafer including solder layers is coated with a flux layer, and solder layers are reflowed to round each of the solder layers, thereby forming each solder layer into a solder bump. An adhesive tape is adhered on the flux layer, and a second surface opposite to the first surface of the IC wafer is ground to form a flip chip semiconductor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.