Semiconductor device with test circuit
US6060899A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 19, 1998 |
| Grant date | May 9, 2000 |
| Priority date | — |
| Expiry date | Mar 19, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/44
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a semiconductor circuit device, a wiring line is connected to an internal circuit and to a test circuit which is connected to a power supply voltage line and a ground voltage line. The test circuit includes a first fuse resistor connected to the power supply voltage line, a first resistor connected between the first fuse resistor and the ground voltage line, a second resistor connected to the power supply voltage line, a second fuse resistor connected between the second resistor and the ground voltage line, a p-type transistor and an n-type transistor. The p-type transistor has a first drain connected to the wiring line, a first source connected to the power supply voltage line, and a gate connected to a connection point between the first fuse resistor and the first resistor. Also, the n-type transistor has a second drain connected to the wiring line, a second source connected to the ground voltage line, and a second gate connected to a connection point between the second resistance and the second fuse resistor.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.