Method and apparatus for generating test pattern for sequence detection
US6061817A · kind A · utility
22Cited by
7References
36Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 2, 1997 |
| Grant date | May 9, 2000 |
| Priority date | — |
| Expiry date | Dec 2, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31813
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for generating a serial test pattern for sequence detection. The serial test pattern has a first plurality of bits and is generated by a pattern generator. A second plurality of bits is generated having a first value. The second plurality of bits includes less bits than the first plurality of bits. The first value of the second plurality of bits is then compared with one or more numbers to generate a comparison result. A next bit is then generated in the serial pattern based upon the comparison result and one or more bits of the second plurality of bits.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.