Patent · US Expired

Method and apparatus for in situ gas concentration measurement

US6064488A · kind A · utility

89Cited by

43References

11Claims

0Family size

Assignee

Monitor Labs, Inc. · US

Inventors

Joel Brand · Santa Clara, US
Garth A. Monlux · Castle Rock, US
Patrick Zmarzly · Boulder, US
Gregory J. Fetzer · Tucson, US
Benjamin C. Halsted · Littleton, US
Kenneth W. Groff · Littleton, US
Jamine Lee · Burlington, US
Neil Goldstein · Belmont, US
Steven Richtsmeier · Tewksbury, US
Fritz Bien · Concord, US

Key dates

Filing date	Jun 6, 1997
Grant date	May 16, 2000
Priority date	—
Expiry date	Jun 6, 2017

Classification

Technology area (CPC G)Physics
CPC primaryG01N2021/8521
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method and apparatus for in situ measurement of the concentration of a gas with a frequency modulated tunable diode laser is disclosed. The sampling cell, which is mounted in the flow of gases to be measured, is a Herriott cell. Gas enters the sampling cell through sintered metal filters that prevent entrance of particulates. Signals from a sample detector and a null detector are compared to eliminate interference patterns from the laser optics. High accuracy dynamic calibration of the apparatus is also disclosed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.