Radiation induced single event latchup protection and recovery of integrated circuits
US6064555A · kind A · utility
Inventors
Key dates
| Filing date | Feb 25, 1997 |
| Grant date | May 16, 2000 |
| Priority date | — |
| Expiry date | Feb 25, 2017 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/3025
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
An apparatus is disclosed for improving the Single Event Latchup (SEL) performance of an integrated circuit device (IC), or grouping of devices (as an example Multi-Chip Modules or MCMs), through the addition of active electronic circuitry integrated within the IC or MCM package. This circuitry and the protected device can be incorporated within the same physical dimensions and electrical configuration as the original integrated circuit device. The circuitry turns a destructive Latchup of a device into a recoverable event, allowing electronic devices that where unsuitable for the space environment due to SEL to be useable in the space environment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.