Computer aided inspection machine
US6064759A · kind A · utility
Inventors
Key dates
| Filing date | Nov 6, 1997 |
| Grant date | May 16, 2000 |
| Priority date | — |
| Expiry date | Nov 6, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/024
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic inspection method and apparatus using structured light and machine vision cameras to inspect an object in conjunction with the geometric model of the object is disclosed. Camera images of the object are analyzed by computer to produce the location of points on the object's surfaces in three dimensions. During a setup phase before object inspection, the points are analyzed with respect to the geometric model computer file of the object. Many points are eliminated to reduce data-taking and analysis time to a minimum and to prevent extraneous reflections from producing errors. When similar objects are subsequently inspected, points from each surface of interest are spatially averaged to give high accuracy measurements of object dimensions. The inspection device uses several multiplexed sensors, each composed of a camera and a structured light source, to measure all sides of the object on a single pass. Calibration and compensation methods are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.