Patent · US Expired

Cytological system illumination integrity checking apparatus and method

US6067370A · kind A · utility

6Cited by
23References
9Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 15, 1997
Grant dateMay 23, 2000
Priority date
Expiry dateAug 15, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06V20/69
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for checking cytological system illumination including the steps of checking global illumination variation, static field uniformity, dynamic field uniformity, specimen thickness variation, strobe repeatability, calibration plate cleanliness, and strobe dropout. A calibration plate and test target is employed for various illumination checks.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.