Non-volatile memory cell having a high coupling ratio
US6069382A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Feb 11, 1998 |
| Grant date | May 30, 2000 |
| Priority date | — |
| Expiry date | Feb 11, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10D64/035
Abstract
A non-volatile memory cell includes a floating gate having a bottom surface in contact with a tunnel layer formed on the substrate, a top surface, and sidewall surfaces oriented along the bitline direction and along the wordline direction of the memory cell. A dielectric layer covers at least a portion of the top surface and covers at least a portion of the surfaces oriented along the bitline and wordline directions. A control gate overlaps the floating gate over substantially all of its surface area. A plurality of self-aligned sidewall spacers are provided, disposed against at least the dielectric layer and the control gate sidewalls. By overlapping the control gate over the floating gate, a greater surface area is made available for charge storage and/or for increasing the coupling ratio of the memory cell. This allows the width of wing structures to be decreased, while maintaining a high coupling ratio. This greater surface area, by increasing the coupling ratio of the memory cell, also allows the use of low programming and erase voltages. Charge retention and coupling are also increased by substantially overlapping or encapsulating the floating gate by the control gate, thus k…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.