Process and arrangement for laser-induced spectral analysis

US6069695A · kind A · utility

Assignee

• Emtec Magnetics GmbH · DE

Inventors

• Klaus Rohr · Berlin, DE
• Jochen Eicher · Monsheim, DE
• Norbert Muller · Tamm, DE

Key dates

• Filing date: Nov 30, 1998
• Grant date: May 30, 2000
• Expiry date: Nov 30, 2018

Classification

• Technology area (CPC G): Physics
• CPC primary: G01N21/718
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

A pulsed laser is employed for quantitative spectral analysis of halogen-containing, nonmetallic or at most partially metallic materials in combination with an image recorder, a spectrometer and a CCD camera, by detecting, summing and analysing the luminous intensity of at least a volume slice from the expansion cone of the plasma, this making it possible, advantageously, for temperature and density gradients to be measured.