Automated visual inspection apparatus for detecting defects and for measuring defect size
US6072900A · kind A · utility
7Cited by
4References
37Claims
0Family size
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Key dates
| Filing date | Nov 19, 1998 |
| Grant date | Jun 6, 2000 |
| Priority date | — |
| Expiry date | Nov 19, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30121
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Apparatus for detecting etch defects in an object having a plurality of openings by generating an image signal of the object representing light intensity values of a plurality of pixels, processing the image signal to form data signals representing light intensity values of groups of pixels, filtering the data signals to remove signals representing the ends of the openings, and pairing two data signals when the groups of pixels represented thereby represent an etch defect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.