Enhanced reset and built-in self-test mechanisms for single function and multifunction input/output devices
US6073253A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 19, 1997 |
| Grant date | Jun 6, 2000 |
| Priority date | — |
| Expiry date | Dec 19, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F1/24
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An apparatus, system and method permitting a variety of reset procedures and corresponding reset states. A device reset control register is provided for each I/O device adapter in single function or multifunction devices. The device reset control registers permit a greater degree of control over single function devices, multifunction device as a whole and individual device functions within a multifunction device. A device immediate status register synchronizes the various reset procedures. A logical power on reset procedure, a directed unit reset procedure and a directed interface reset procedure utilize the greater degree of control that the device reset control registers provide to force the I/O device adapter, single function device or multifunction device into a corresponding logical power on reset state, a directed unit reset state or a directed interface reset state. Each of these reset states is well-defined and has the advantage of predictable behavior during and after execution of the corresponding reset procedure. A built-in self-test procedure is also defined that sequentially examines each function associated within a multifunction device connected to the local bus to c…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.