Patent · US Expired

Micron-scale differential scanning calorimeter on a chip

US6079873A · kind A · utility

60Cited by
12References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 30, 1998
Grant dateJun 27, 2000
Priority date
Expiry dateJun 30, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N25/4866
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A differential scanning microcalorimeter produced on a silicon chip enables microscopic scanning calorimetry measurements of small samples and thin films. The chip may be fabricated using standard CMOS processes. The microcalorimeter includes a reference zone and a sample zone. The reference and sample zones may be at opposite ends of a suspended platform or may reside on separate platforms. An integrated polysilicon heater provides heat to each zone. A thermopile consisting of a succession of thermocouple junctions generates a voltage representing the temperature difference between the reference and sample zones. Temperature differences between the zones provide information about the chemical reactions and phase transitions that occur in a sample placed in the sample zone.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.