Patent · US Expired

Device for optically measuring an object using a laser interferometer

US6084672A · kind A · utility

6Cited by
1References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 15, 1998
Grant dateJul 4, 2000
Priority date
Expiry dateSep 15, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/65
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A device is provided for optical measurement of an object, in particular for path and/or vibration measurements, using a laser interferometer, wherein a measuring beam is input into the beam path of a microscope. The device has a mechanism for shifting the measuring beam in an approximately parallel manner. The input of the measuring beam is accomplished via a camera connection of the microscope. The shifting device causes a shift of the impact point of the measuring beam on the measurement object, and the measuring beam reflected back or scattered from the measurement object is decoupled via the camera connection from the beam path of the microscope.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.