Single event upset tolerant system and method
US6085350A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 4, 1998 |
| Grant date | Jul 4, 2000 |
| Priority date | — |
| Expiry date | Mar 4, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/187
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An single event upset (SEU) tolerant system for detecting and correcting an SEU includes a decision element (200) for receiving a plurality of outputs (120) from a plurality of signal generators (105) and producing an output (130) therefrom. The decision element includes voters which provide two levels of voting for the plurality of redundant outputs (120). First-level voters (300) provide intermediate voted outputs (315) which are received by a second-level voter to determine an output (130). An output disabler (400) determines when an output is provided external to the decision element. A plurality of comparators (210) receive intermediate voted outputs (315) from first-level voters and compare with a plurality of outputs from a plurality of signal generators to determine upset detected signals (125). An upset detected signal controls the selection of feedback for an element having experienced an SEU.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.