Patent · US Expired

Apparatus and method for detecting mass eccentricity

US6085578A · kind A · utility

3Cited by
2References
9Claims
0Family size

Assignees

Inventors

Key dates

Filing dateMay 22, 1998
Grant dateJul 11, 2000
Priority date
Expiry dateMay 22, 2018

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01M1/06
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A spherical object is positioned on a rotation stage, the rotation stage is rotated, and a deviation detector detects whether the spherical object deviates from the rotation stage or not. A rotation frequency of the rotation stage when the object deviates from the rotation stage is detected by a rotation frequency detector, and a judgement system judges whether the object is mass eccentric or not, comparing the detected rotation frequency with a predetermined rotation frequency which is set beforehand.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.