Reflection characteristic measuring apparatus
US6088117A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 27, 1998 |
| Grant date | Jul 11, 2000 |
| Priority date | — |
| Expiry date | Aug 27, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/065
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A reflection characteristic of a sample is measured using an integrating sphere by: measuring an apparent reflectance of a reference sample by using integrating sphere, the reference sample having a known true reflectance under a given illumination condition; calculating coefficients for rendering a linear combination of a measured apparent reflectance of the reference sample and N-th power (N is 2 or more integer) of the measured apparent reflectance closer to the known true reflectance of the reference sample; storing calculated coefficients in a storage medium as coefficients for the given illumination condition; measuring an apparent reflectance of a desired sample by using the integrating sphere; calculating a true reflectance of the desired sample under the given illumination condition by multiplying the terms of the linear combination of an measured apparent reflectance of the desired sample and N-th power of the measured apparent reflectance of the desired sample by the coefficients stored in the storage medium, respectively.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.