Method and device for testing a semiconductor serial access memory device through a main memory
US6088274A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 18, 1999 |
| Grant date | Jul 11, 2000 |
| Priority date | — |
| Expiry date | Feb 18, 2019 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/003
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and apparatus for testing a semiconductor serial access memory (30) device through a main memory (20) includes a semiconductor memory comprising a main memory (20) and a serial access memory (30). A test data (48) is generated and an expected test data (50) that is equivalent to the test data (48) is also generated. The test data (48) is stored in the main memory and sent to the serial access memory (30). The test data (48) in the serial access memory is then sent back to the main memory (20) and stored in the main memory (20). The test data (48) is then read from the main memory (20). Then, the test data (48) read from the main memory is compared with the expected test data (50), producing an output having a first state if the test data (48) read from the main memory (20) is similar to the expected test data (50) or a second state if the test data (48) read from the main memory (20) is different than the expected test data (50).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.