Noncontact temperature distribution measuring apparatus
US6089750A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 24, 1998 |
| Grant date | Jul 18, 2000 |
| Priority date | — |
| Expiry date | Sep 24, 2018 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T83/293
- WIPO fieldMachine tools
- WIPO sectorMechanical engineering
Abstract
A material to be cut has a face to be cut with a cutting tool, and a cutout which temporarily brings the cutting tool into a noncontact state. Images of the cutting tool during the period when it attains an exposed state by passing over the cutout are captured with a camera mechanism at an interval of a predetermined delay time .tau.. A plurality of image information items obtained by these capturing operations include temperature change information of each location as the cutting tool gradually passes from the point of instant when it enters the cutout. Therefore, the image information items are arranged in relation to the exposure time from the point of instant, and a two-dimensional temperature distribution of the cutting tool at the point of instance is computed according to the tendency of change in image information.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.