Glide height test signal processor and method using increased high frequency components
US6092412A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | May 5, 1998 |
| Grant date | Jul 25, 2000 |
| Priority date | — |
| Expiry date | May 5, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B33/10
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A glide height test signal processor and method using increased high frequency components is disclosed. The processor is more sensitive to smaller asperities, maintains the positive characteristics of being monotonic and can be easily calibrated. The system includes a circuit for converting asperity contact to an electrical signal, a first bandpass circuit coupled to the first circuit, the first bandpass circuit having a first amplifier for amplifying the electrical signal by a first gain to generate a first amplified signal and a first filter for filtering the first amplified signal at a high frequency to generate a first filtered signal, wherein the first gain is selected for detection of asperities having a diameter of less than or equal to five microns and a processing circuit, coupled to the first bandpass circuit, for processing the first filtered signal to generate an indication of contact with an asperity having a diameter of less than or equal to five microns. A second bandpass circuit may be coupled to the first circuit, wherein the second bandpass circuit has a second amplifier for amplifying the electrical signal by a second gain to generate a second amplified signal an…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.