Patent · US Expired

Method of manufacturing inductor device on a silicon substrate thereof

US6093599A · kind A · utility

25Cited by
8References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 19, 1999
Grant dateJul 25, 2000
Priority date
Expiry dateJan 19, 2019

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/00
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a on silicon substrate, specifically to an inductor device and manufacturing method thereof for enhancing the quality factor of the inductor by disposing trenches on a silicon substratre, and by filling the inside of the trenches with polycrystalline polysilicon not doped with impurities. The present invention provides an inductor device and a manufacturing method thereof which can improve the quality factor by increasing resistance of the substrate by forming deep trenches disposed in specific patterns on a low-resistance silicon substrate and filling polycrystalline silicon not doped with impurities, and by reducing parasitic capacitance between the inductor and the silicon substrate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.