Apparatus and method for detecting memory effect in nickel cadmium batteries
US6094051A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 15, 1998 |
| Grant date | Jul 25, 2000 |
| Priority date | — |
| Expiry date | Sep 15, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3648
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention provides for a timesaving method of determining whether a nickel cadmium (NiCd) battery is stricken with memory effect. A fully charged NiCd battery under test ("test battery") is subjected to a positive sloped current charge ramp and then a negative sloped current charge ramp while continuously monitoring the battery terminal voltage. The maximum measured terminal voltage of the test battery is compared to the measured terminal voltage of a NiCd battery of the same nominal voltage and capacity and known not to have memory effect ("normal"battery). A NiCd battery is determined to have memory effect if the maximum voltage of the test battery exceeds the maximum voltage of the normal battery.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.