Method of determining the density profile
US6094470A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 2, 1998 |
| Grant date | Jul 25, 2000 |
| Priority date | — |
| Expiry date | Sep 2, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/083
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of determining the density profile of a plate-shaped material M, the density of which varies discretely or continuously across the plate thickness, whereas the density at a specific depth of the plate M is preferably assumed to be constant. The inventive method employs X-rays or .gamma.-rays from a source K. The latter source K is placed on one side of the plate M, whereas at least two detectors T, F are arranged on the opposite side of the endless plate being advanced during the measuring in the longitudinal direction. A first detector T is preferably placed in the radiating direction of the source and measures the transmittent radiation through the plate M, and the second detector F is placed outside the radiating direction of the source K and measures the scattered radiation on partial volumes along the radiating direction of the source. Based on the signals measured by the detectors it is possible to measure the density in each individual partial volume. According to the invention a compensation has furthermore been carried out for multiple scattered radiation by the measured radiation being deducted from the multiple scattered radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.